1. Empirical evaluation of mutation‐based test case prioritization techniques. (21st December 2018) Authors: Shin, Donghwan; Yoo, Shin; Papadakis, Mike; Bae, Doo‐Hwan Other Names: Just René guestEditor.; Krinke Jens guestEditor.; Li Nan guestEditor.; Rojas José Miguel guestEditor. Journal: Software testing, verification & reliability Issue: Volume 29:Number 1/2(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Employing second‐order mutation for isolating first‐order equivalent mutants. (21st April 2014) Authors: Kintis, Marinos; Papadakis, Mike; Malevris, Nicos Other Names: Jia Yue guestEditor.; Merayo Mercedes guestEditor.; Harman Mark guestEditor. Journal: Software testing, verification & reliability Issue: Volume 25:Number 5/7(2015) Page Start: 508 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Metallaxis‐FL: mutation‐based fault localization. (9th September 2013) Authors: Papadakis, Mike; Le Traon, Yves Other Names: Jia Yue guestEditor.; Merayo Mercedes guestEditor.; Harman Mark guestEditor. Journal: Software testing, verification & reliability Issue: Volume 25:Number 5/7(2015) Page Start: 605 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Mutation analysis and its industrial applications. (5th August 2022) Authors: Gopinath, Rahul; Zhang, Jie M.; Kintis, Marinos; Papadakis, Mike Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 8(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Mutation analysis and its industrial applications. (8th August 2022) Authors: Gopinath, Rahul; Zhang, Jie M.; Kintis, Marinos; Papadakis, Mike Other Names: Gopinath Rahul guestEditor.; Zhang Jie M. guestEditor.; Kintis Marinos guestEditor.; Papadakis Mike guestEditor. Journal: Software testing, verification & reliability Issue: Volume 32:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗