1. A new quantitative X‐ray system for micro‐PIXE analysis. (16th May 2017) Authors: Pallon, Jan; De La Rosa, Nathaly; Elfman, Mikael; Kristiansson, Per; Nilsson, E.J. Charlotta; Ros, Linus Other Names: Boman Johan guestEditor. Journal: X-ray spectrometry Issue: Volume 46:Number 5(2017) Page Start: 319 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗