1. Performance and Reliability of SiC Power MOSFETs. Issue 2 (2016) Authors: Lichtenwalner, Daniel J.; Hull, Brett; Pala, Vipindas; Van Brunt, Edward; Ryu, Sei-Hyung; Sumakeris, Joe J.; O'Loughlin, Michael J.; Burk, Albert A.; Allen, Scott T.; Palmour, John W. Journal: MRS advances Issue: Volume 1:Issue 2(2016) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗