1. Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy. (7th February 2012) Authors: Dehlinger, M.; Dorczynski, C.; Fauquet, C.; Jandard, F.; Tonneau, D.; Bjeoumikhov, A.; Bjeoumikhova, S.; Gubzhokov, R.; Erko, A.; Zizak, I.; Pailharey, D.; Ferrero, S.; Dahmani, B. Journal: International journal of nanotechnology Issue: Volume 9:Number 3/4/5/6/7(2012) Page Start: 460 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Toward sub‐micro‐XRF working at nanometer range using capillary optics. (19th July 2013) Authors: Dehlinger, M.; Fauquet, C.; Jandard, F.; Bjeoumikhov, A.; Bjeoumikhova, S.; Gubzhokov, R.; Erko, A.; Zizak, I.; Pailharey, D.; Ferrero, S.; Dahmani, B.; Tonneau, D. Journal: X-ray spectrometry Issue: Volume 42:Number 6(2013:Nov./Dec.) Page Start: 456 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗