1. Deposition and Characterization of CVD-Grown Ge-Sb Thin Film Device for Phase-Change Memory Application. (23rd April 2012) Authors: Huang, C. C.; Gholipour, B.; Knight, K.; Ou, J. Y.; Hewak, D. W. Other Names: Gupta Ram Academic Editor. Journal: Advances in optoelectronics Issue: Volume 2012(2012) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗