1. Coupled electronic and atomic effects on defect evolution in silicon carbide under ion irradiation. Issue 6 (December 2017) Authors: Zhang, Yanwen; Xue, Haizhou; Zarkadoula, Eva; Sachan, Ritesh; Ostrouchov, Christopher; Liu, Peng; Wang, Xue-lin; Zhang, Shuo; Wang, Tie Shan; Weber, William J. Journal: Current opinion in solid state & materials science Issue: Volume 21:Issue 6(2017) Page Start: 285 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗