1. Introduction of deep level impurities, S, Se, and Zn, into Si wafers for high-temperature operation of a Si qubit. (1st April 2023) Authors: Ban, Yoshisuke; Kato, Kimihiko; Iizuka, Shota; Murakami, Shigenori; Ishibashi, Koji; Moriyama, Satoshi; Mori, Takahiro; Ono, Keiji Journal: Japanese journal of applied physics Issue: Volume 62:Number SC(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. ON current enhancement and variability suppression in tunnel FETs by the isoelectronic trap impurity of beryllium. (29th January 2021) Authors: Ban, Yoshisuke; Kato, Kimihiko; Iizuka, Shota; Moriyama, Satoshi; Ishibashi, Koji; Ono, Keiji; Mori, Takahiro Journal: Japanese journal of applied physics Issue: Volume 60:Number SB(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Poor clinical outcome of elderly patients with primary plasma cell leukemia treated with novel agents: real-world experience. Issue 11 (19th September 2022) Authors: Saburi, Masuho; Sakata, Masanori; Takata, Hiroyuki; Miyazaki, Yasuhiko; Kawano, Katsuya; Sasaki, Hitohiro; Abe, Miyuki; Kohno, Kazuhiro; Soga, Yasuhiro; Nagamatsu, Kentaro; Ono, Keiji; Nakayama, Toshiyuki; Ohtsuka, Eiichi Journal: Leukemia & lymphoma Issue: Volume 63:Issue 11(2022) Page Start: 2691 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Probing hole spin transport of disorder quantum dots via Pauli spin-blockade in standard silicon transistors. (7th April 2021) Authors: Hillier, Joseph; Ono, Keiji; Ibukuro, Kouta; Liu, Fayong; Li, Zuo; Husain Khaled, Muhammad; Nicholas Rutt, Harvey; Tomita, Isao; Tsuchiya, Yoshishige; Ishibashi, Koji; Saito, Shinichi Journal: Nanotechnology Issue: Volume 32:Number 26(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗