1. Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations. (August 2019) Authors: Tanaka, Shigeyasu; Ohmi, Yusuke Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 902 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations. (August 2020) Authors: Tanaka, Shigeyasu; Ohmi, Yusuke Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2692 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗