1. Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC. (August 2022) Authors: Chan, Ho Leung; Fields, Shelby S.; O'Neill, Tristan; Chen, Yueyun; Hubbard, William A.; Ihlefeld, Jon F.; Regan, B. C. Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2270 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis. (August 2021) Authors: O'Neill, Tristan; Regan, B. C.; Mecklenburg, Matthew Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1540 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗