1. XPS Surface analysis augmented using correlative spectroscopy and microscopy. (August 2022) Authors: Nunney, Tim S; Mack, Paul; Oppong-Mensah, Helen; Baker, Mark; England, Jonathan Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 978 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗