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You searched for: Author/Creator Nohl, James F.Limit your search
- Nohl, James F. [remove] 2
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- AE Auger electron -- AES Auger electron spectroscopy -- AM Additive manufacturing -- AV Accelerating voltage -- BD Beam deceleration -- BSE Backscatter electron -- CB Carbon black -- CD Critical dimension -- CF Carbon fiber -- CM CarbonMide® -- CT Computerized tomography -- DOS Density of states -- EBID Electron beam induced deposition -- EDX Energy dispersive X-ray -- EF Energy filtered -- EL Landing energy, energy at which PEs interact with the specimen -- EOS Electro Optical Systems -- ETD Everhart-Thornley detector -- FIB Focussed ion beam -- FOV Field of view -- HeIM Helium ion microscope -- HFW Horizontal field width -- HOPG Highly oriented pyrolytic graphite -- HV High-voltage -- I0 Incident beam current -- IMFP Inelastic mean free path, mean distance the SE travels between inelastic collisions -- KPAFM Kelvin probe atomic force microscopy -- LIB Lithium-ion battery -- LV Low-voltage -- MAI Methylamonium iodide -- MAPbI3 Methylamonium lead iodide -- MAST-SEY MAterial Simulation Toolkit for Secondary Electron Yield -- MED Mean escape depth, average depth from the surface that SEs are emitted from -- MV Mirror Voltage -- NMC Nickel manganese cobalt oxide -- NMP N-methyl pyrrolidone -- NRMSD Normalized root mean square deviation -- OPV Organic photovoltaic -- P3HT poly(3-hexylthiophene) -- PA Polyamide -- PE Primary electron, electron in the incident electron beam -- PFIB Plasma focussed ion beam -- PVDF Polyvinylidene fluoride -- ROI Region of interest -- SAM Scanning Auger microscope -- SD Standard deviation -- SDD Silicon drift detector -- SE Secondary electron -- SE1 SE emissions localized to the PE interaction from which UHR SE images are formed -- SE2 SE emissions delocalized in time and space from the PE interaction -- SEHI Secondary electron hyperspectral imaging -- SEM Scanning electron microscope/microscopy -- SLS Selective laser sintering -- STEM Scanning transmission electron microscope -- SEY Secondary electron yield, the ratio of emitted SEs to PEs -- TEM Transmission electron microscope -- TLD Through-lens detector -- UC UniColore -- UHR Ultra-high resolution -- UHV Ultra-high vacuum -- WD Working distance, distance between where the electron beam is focussed and the pole piece -- XPS X-ray photoelectron spectroscopy -- φ Work function, minimum energy required to remove an electron from a metal surface 1
- Electron Probe Microanalysis -- Periodicals 1
- Low-voltage scanning electron microscopy (LV-SEM) -- Secondary electron hyperspectral imaging (SEHI) -- Powder characterization -- Energy storage materials -- Additive manufacturing (AM) materials 1
- Materials science -- Periodicals 1
- Metallurgy -- Periodicals 1
- Microscopie -- Périodiques 1
- Microscopy 1
- Microscopy -- Periodicals 1