1. Minority Carrier Annihilation at Crystalline Silicon Interface in Metal Oxide Semiconductor Structure. Issue 1666 (3rd November 2014) Authors: Furukawa, Jun; Shigeno, Satoshi; Yoshidomi, Shinya; Node, Tomohito; Hasumi, Masahiko; Sameshima, Toshiyuki; Mizuno, Tomohisa Editors: Stradins, P.; Collins, R.; Finger, F.; Wyrsch, N.; Terakawa, A. Journal: MRS proceedings Issue: Issue 1666:(2014) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗