1. Characterization and Comparison of Detector Systems for Large Area X-ray Imaging. (23rd September 2015) Authors: Davis, Jeffrey M.; Schmidt, Julia; Huth, Martin; Ihle, Sebastian; Steigenhofer, Daniel; Holl, Peter; Lutz, Gerhard; Weber, Udo; Niculae, Adrian; Soltau, Heike; Struder, Lothar Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1637 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Characterization and Comparison of Detector Systems for Large Area X-ray Imaging. (August 2015) Authors: Davis, Jeffrey M.; Schmidt, Julia; Huth, Martin; Ihle, Sebastian; Steigenhofer, Daniel; Holl, Peter; Lutz, Gerhard; Weber, Udo; Niculae, Adrian; Soltau, Heike; Struder, Lothar Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1637 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Detection of Low Energy X-rays with High Efficiency and Spectral Resolution. (August 2019) Authors: Strüder, Lothar; Soltau, Heike; Niculae, Adrian; Aschauer, Stefan; Hartmann, Robert; Davis, Jeff Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 272 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Development of the Silicon Drift Detector for Electron Microscopy Applications. (September 2020) Authors: Strüder, Lothar; Niculae, Adrian; Holl, Peter; Soltau, Heike Journal: Microscopy today Issue: Volume 28:Number 5(2020) Page Start: 46 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy. (August 2019) Authors: Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Lackner, Robert; Hermenau, Kathrin; Heizinger, Klaus; Mönninghoff, Tristan; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 516 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium. (August 2019) Authors: Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Hermenau, Kathrin; Heinzinger, Klaus; Liebel, Andreas; Soltau, Heike; Strüder, Lothar Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1768 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Setup and Practical Applications of a pnCCD Based XRF System. (23rd September 2015) Authors: Davis*, Jeffrey M.; Schmidt, Julia; Huth, Martin; Ihle, Sebastian; Steigenhofer, Daniel; Holl, Peter; Lutz, Gerhard; Weber, Udo; Niculae, Adrian; Soltau, Heike; Striider, Lothar Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Setup and Practical Applications of a pnCCD Based XRF System. (August 2015) Authors: Davis*, Jeffrey M.; Schmidt, Julia; Huth, Martin; Ihle, Sebastian; Steigenhofer, Daniel; Holl, Peter; Lutz, Gerhard; Weber, Udo; Niculae, Adrian; Soltau, Heike; Striider, Lothar Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗