1. Understanding the effects of off-state and hard-switching stress in gallium nitride-based power transistors. (12th November 2020) Authors: Nicola, Modolo; De Santi, Carlo; Minetto, Andrea; Sayadi, Luca; Sicre, Sebastien; Prechtl, Gerhard; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo Journal: Semiconductor science and technology Issue: Volume 36:Number 1(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗