Author/Creator: Niang, Kham Man - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Niang, Kham Man

1. (Invited) Stability under Gate Bias Stressing of Amorphous Oxide Thin Film Transistors. (18th August 2016)

Authors:: Niang, Kham Man; Flewitt, Andrew J.
Journal:: ECS transactions
Issue:: Volume 75:Number 10(2016)
Page Start:: 179
Record Type:: Journal Article
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2. Effect of Plasma Treatment on Metal Oxide p–n Thin Film Diodes Fabricated at Room Temperature. Issue 10 (1st April 2021)

Authors:: Khong, Yin Jou; Niang, Kham Man; Han, Sanggil; Coburn, Nigel J.; Wyatt‐Moon, Gwenhivir; Flewitt, Andrew J.
Journal:: Advanced materials interfaces
Issue:: Volume 8:Issue 10(2021)
Page Start:: n/a
Record Type:: Journal Article
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