Author/Creator: Ngoepe, P.N.M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ngoepe, P.N.M.

1. DLTS characterization of defects in GaN induced by electron beam exposure. (15th June 2017)

Authors:: Ngoepe, P.N.M.; Meyer, W.E.; Auret, F.D.; Omotoso, E.; Diale, M.
Journal:: Materials science in semiconductor processing
Issue:: Volume 64(2017)
Page Start:: 29
Record Type:: Journal Article
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2. Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC. (15th August 2016)

Authors:: Omotoso, E.; Meyer, W.E.; Coelho, S.M.M.; Diale, M.; Ngoepe, P.N.M.; Auret, F.D.
Journal:: Materials science in semiconductor processing
Issue:: Volume 51(2016:Aug.)
Page Start:: 20
Record Type:: Journal Article
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