1. AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis. (May 2020) Authors: Novotna, Veronika; Horak, Josef; Konecny, Martin; Hegrova, Veronika; Novotny, Ondrej; Novacek, Zdenek; Neuman, Jan Journal: Microscopy today Issue: Volume 28:Number 3(2020) Page Start: 38 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science. (August 2022) Authors: Hegrova, Veronika; Dao, Radek; Neuman, Jan Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2120 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis. (August 2019) Authors: Neuman, Jan; Novacek, Zdenek; Pavera, Michal; Novotna, Veronika Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 430 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Czech education in nature traditions. Issue 1 (6th April 2020) Authors: Martin, Andrew; Watson, Geoff; Neuman, Jan; Turčová, Ivana; Kalkusová, Lucie Journal: History of education review Issue: Volume 49:Issue 1(2020) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Multidimensional Sample Surface Analysis by AFM-in-SEM. (August 2020) Authors: Novotna, Veronika; Hegrova, Veronika; Horak, Josef; Novacek, Zdenek; Pavera, Michal; Neuman, Jan Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1798 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗