1. Characterization of pixel sensor designed in 180 nm SOI CMOS technology. (19th January 2018) Authors: Benka, T.; Havranek, M.; Hejtmanek, M.; Jakovenko, J.; Janoska, Z.; Marcisovska, M.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Vrba, V. Journal: Journal of instrumentation Issue: Volume 13:Number 1(2018:Jan.) Page Start: C01025 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. PantherPix hybrid pixel γ-ray detector for radio-therapeutic applications. (22nd February 2018) Authors: Neue, G.; Benka, T.; Havránek, M.; Hejtmánek, M.; Janoška, Z.; Kafka, V.; Korchak, O.; Lednický, D.; Marčišovská, M.; Marčišovský, M.; Popule, J.; Şmarhák, J.; Şvihra, P.; Tomášek, L.; Vrba, V.; Konček, O.; Semmler, M. Journal: Journal of instrumentation Issue: Volume 13:Number 2(2018:Feb.) Page Start: C02036 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Radiation hardness of PantherPix hybrid pixel detector. (7th December 2021) Authors: Dudas, D.; Kafka, V.; Marcisovsky, M.; Neue, G.; Marcisovska, M.; Prusa, P.; Koniarova, I.; Semmler, M. Journal: Journal of instrumentation Issue: Volume 16:Number 12(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Runaway electron diagnostics using silicon strip detector. (1st July 2020) Authors: Novotny, L.; Cerovsky, J.; Dhyani, P.; Ficker, O.; Havranek, M.; Hejtmanek, M.; Janoska, Z.; Kafka, V.; Kulkov, S.; Marcisovska, M.; Marcisovsky, M.; Neue, G.; Svihra, P.; Svoboda, V.; Tomasek, L.; Tunkl, M.; Vrba, V. Journal: Journal of instrumentation Issue: Volume 15:Number 7(2020) Page Start: C07015 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. The SpacePix-D radiation monitor technology demonstrator. (17th December 2018) Authors: Vrba, V.; Benka, T.; Fojtik, J.; Havranek, M.; Janoska, Z.; Kafka, V.; Marcisovska, M.; Marcisovsky, M.; Neue, G.; Suchanek, P.; Svihra, P.; Sysala, R.; Tomasek, L.; Vancura, P. Journal: Journal of instrumentation Issue: Volume 13:Number 12(2018:Dec.) Page Start: C12017 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Time of flight measurements with the PH32 chip. (12th April 2019) Authors: Janoska, Z.; Benka, T.; Havranek, M.; Hejtmanek, M.; Jakovenko, J.; Kafka, V.; Kaschner, M.; Marcisovska, M.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Svihra, P.; Vancura, P.; Vrba, V. Journal: Journal of instrumentation Issue: Volume 14:Number 4(2019) Page Start: C04004 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗