1. Configurable Resistive Response in BaTiO3 Ferroelectric Memristors via Electron Beam Radiation. Issue 12 (12th February 2020) Authors: Molinari, Alan; Witte, Ralf; Neelisetty, Krishna Kanth; Gorji, Saleh; Kübel, Christian; Münch, Ingo; Wöhler, Franziska; Hahn, Lothar; Hengsbach, Stefan; Bade, Klaus; Hahn, Horst; Kruk, Robert Journal: Advanced materials Issue: Volume 32:Issue 12(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations. (4th March 2019) Authors: Neelisetty, Krishna Kanth; Mu, Xiaoke; Gutsch, Sebastian; Vahl, Alexander; Molinari, Alan; von Seggern, Falk; Hansen, Mirko; Scherer, Torsten; Zacharias, Margit; Kienle, Lorenz; Chakravadhanula, VS Kiran; Kübel, Christian Journal: Microscopy and microanalysis Issue: Volume 25:Number 3(2019) Page Start: 592 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations. (June 2019) Authors: Neelisetty, Krishna Kanth; Mu, Xiaoke; Gutsch, Sebastian; Vahl, Alexander; Molinari, Alan; von Seggern, Falk; Hansen, Mirko; Scherer, Torsten; Zacharias, Margit; Kienle, Lorenz; Chakravadhanula, VS Kiran; Kübel, Christian Journal: Microscopy and microanalysis Issue: Volume 25:Number 3(2019) Page Start: 592 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Novel thin film lift-off process for in situ TEM tensile characterization. (August 2021) Authors: Neelisetty, Krishna Kanth; CN, Shyam Kumar; Kashiwar, Ankush; Scherer, Torsten; Chakravadhanula, VS Kiran; Kuebel, Christian Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 216 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Transfer of lithium foil under inert conditions using CleanConnect inert gas transfer system. (August 2021) Authors: Neelisetty, Krishna Kanth; Stetina, Jakub; Vondruška, Jindřich; Trenz, Milos; Kazda, Tomas; Hrouzek, Michal; Wandrol, Petr Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2508 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗