1. Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. (15th February 2017) Authors: Vilalta-Clemente, A.; Naresh-Kumar, G.; Nouf-Allehiani, M.; Gamarra, P.; di Forte-Poisson, M.A.; Trager-Cowan, C.; Wilkinson, A.J. Journal: Acta materialia Issue: Volume 125(2017) Page Start: 125 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗