Author/Creator: Nagarajan, Raghavan - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Nagarajan, Raghavan

1. Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices. (June 2016)

Authors:: Mei, Sen; Bosman, Michel; Nagarajan, Raghavan; Wu, Xing; Pey, Kin Leong
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 71
Record Type:: Journal Article
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