1. Gallium In-Depth Profile in Bromine- Etched Copper–Indium–Galium–(Di)selenide (CIGS) Thin Films Inspected Using Raman Spectroscopy. Issue 6 (June 2017) Authors: Parravicini, Jacopo; Acciarri, Maurizio; Lomuscio, Alberto; Murabito, Matteo; Le Donne, Alessia; Gasparotto, Andrea; Binetti, Simona Journal: Applied spectroscopy Issue: Volume 71:Issue 6(2017) Page Start: 1334 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗