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You searched for: Author/Creator Munnik, Frans

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1. 'Box‐Profile' Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry. Issue 4 (27th July 2019)

4. Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts. (20th May 2018)

5. GGR Biennial Critical Review: Analytical Developments Since 2014. Issue 4 (21st December 2017)

7. Microstructural Studies of Fluorine‐Implanted Titanium Aluminides for Enhanced Environmental Durability1. Issue 1 (9th September 2013)

8. Sub-pixel resolution with a color X-ray camera. Issue 9 (19th September 2015)

10. The recovery effects of electron beam pulse treatment in Sn implanted Ge. Issue 9 (3rd October 2022)