1. BETSEE: testing for system-wide effects of single event effects on ITk strip modules. (1st January 2023) Authors: Belanger-Champagne, C.; Dandoy, J.; Gallop, B.J.; Gosart, T.C.; Helling, C.M.; Keener, P.; Krizka, K.; McGovern, B.; Mullier, G.; Poley, A.-L.; Roberts, B.R.; Sawyer, C.; Wall, A.; Wang, H.; Warren, M. Journal: Journal of instrumentation Issue: Volume 18:Number 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗