1. Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM. (February 2021) Authors: Mullarkey, Tiarnan; Downing, Clive; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 27:Number 1(2021) Page Start: 99 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM. (August 2022) Authors: Mullarkey, Tiarnan; Peters, Jonathan J.P.; Moldovan, Grigore; Garel, Jonathan; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2486 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM. (August 2022) Authors: Mullarkey, Tiarnan; Peters, Jonathan J. P.; Geever, Matthew; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2218 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Improving the Noise Floor and Speed of Your Detector: A Modular Hardware Approach for Under $1000. (August 2022) Authors: Peters, Jonathan J. P.; Mullarkey, Tiarnan; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 2904 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Machine-learning approach for quantified resolvability enhancement of low-dose STEM data. Issue 1 (1st March 2023) Authors: Gambini, Laura; Mullarkey, Tiarnan; Jones, Lewys; Sanvito, Stefano Journal: Machine learning: science and technology Issue: Volume 4:Issue 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Retaining Precision at Low-dose and High-speed STEM Imaging Conditions. (August 2020) Authors: Mullarkey, Tiarnan; Downing, Clive; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2964 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation. (August 2022) Authors: Mullarkey, Tiarnan; Peters, Jonathan J. P.; Downing, Clive; Jones, Lewys Journal: Microscopy and microanalysis Issue: Volume 28:Number 4(2022) Page Start: 1428 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗