1. Towards Machine Vision-enabled STEM EELS for High-throughput Quantification of Grain Boundary Electronic Structure. (August 2020) Authors: Muktevi, Sai; Carreon, David; Bowman, William Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 3098 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗