1. Novel nano-scale absolute linear displacement measurement based on grating projection imaging. (September 2021) Authors: Yu, Hai; Wan, Qiuhua; Mu, Zhiya; Du, Yingcai; Liang, Lihui Journal: Measurement Issue: Volume 182(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗