1. Critical properties of Cu6Sn5 in electronic devices: Recent progress and a review. Issue 2 (April 2016) Authors: Mu, D.K.; McDonald, S.D.; Read, J.; Huang, H.; Nogita, K. Journal: Current opinion in solid state & materials science Issue: Volume 20:Issue 2(2016) Page Start: 55 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗