1. Exploration of Nafion for the Electric-Double-Layer Gating of Metal-Oxide Thin Film Transistors. (8th February 2021) Authors: Mou, Peng-Lin; Huang, Wan-Qing; Yan, Feng-Jie; Wan, Xi; Shao, Feng Journal: ECS journal of solid state science and technology Issue: Volume 10:Number 2(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗