Search

Author/Creator Morancho, Frédéric

1. Analysis study of sensitive volume and triggering criteria of single‐event burnout in super‐junction metal‐oxide semiconductor field‐effect transistors. Issue 3 (1st May 2014)

Authors:
Zerarka, Moustafa; Austin, Patrick; Morancho, Frédéric; Isoird, Karine; Arbess, Houssam; Tasselli, Josiane
Journal:
IET circuits, devices & systems
Issue:
Volume 8:Issue 3(2014)
Page Start:
197
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. Comprehensive characterization of vertical GaN-on-GaN Schottky barrier diodes. (October 2022)

Authors:
Raja, P. Vigneshwara; Raynaud, Christophe; Sonneville, Camille; Eric N'Dohi, Atse Julien; Morel, Hervé; Phung, Luong Viet; Ngo, Thi Huong; De Mierry, Philippe; Frayssinet, Eric; Maher, Hassan; Tasselli, Josiane; Isoird, Karine; Morancho, Frédéric; Cordier, Yvon; Planson, Dominique
Journal:
Microelectronics journal
Issue:
Volume 128(2022)
Page Start:
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

Limit your search