1. Optimisation of sample preparation and analysis conditions for atom probe tomography characterisation of low concentration surface species. (21st July 2016) Authors: Douglas, J O; Bagot, P A J; Johnson, B C; Jamieson, D N; Moody, M P Journal: Semiconductor science and technology Issue: Volume 31:Number 8(2016:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Validity of Vegard's rule for Al1−xInxN (0.08 < x < 0.28) thin films grown on GaN templates. (28th April 2017) Authors: Magalhães, S; Franco, N; Watson, I M; Martin, R W; O'Donnell, K P; Schenk, H P D; Tang, F; Sadler, T C; Kappers, M J; Oliver, R A; Monteiro, T; Martin, T L; Bagot, P A J; Moody, M P; Alves, E; Lorenz, K Journal: Journal of physics Issue: Volume 50:Number 20(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗