1. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (16th August 2017) Authors: Sunday, Christopher E; Montgomery, Karl R.; Amoah, Papa K.; Iwuoha, Emmanuel I; Obeng, Yaw S. Journal: ECS transactions Issue: Volume 80:Number 1(2017) Page Start: 253 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (1st January 2017) Authors: Sunday, Christopher E.; Montgomery, Karl R.; Amoah, Papa K.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 9(2017) Page Start: N155 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (29th August 2017) Authors: Sunday, Christopher E.; Montgomery, Karl R.; Amoah, Papa K.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 9(2017) Page Start: N155 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Broadband Spectroscopic Characterization of Hybrid Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (19th August 2016) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Montgomery, Karl R.; Amoah, Papa K.; You, Lin; Kopanski, Joseph J.; Obrzut, Jan Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 199 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗