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Author/Creator Modolo, Nicola

1. A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects. (November 2020)

Authors:
Modolo, Nicola; Meneghini, Matteo; Barbato, Alessandro; Nardo, Arianna; De Santi, Carlo; Meneghesso, Gaudenzio; Zanoni, Enrico; Sicre, Sebastien; Prechtl, Gerhard; Curatola, Gilberto
Journal:
Microelectronics and reliability
Issue:
Volume 114(2020)
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Record Type:
Journal Article
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2. Failure Physics and Reliability of GaN‐Based HEMTs for Microwave and Millimeter‐Wave Applications: A Review of Consolidated Data and Recent Results. Issue 24 (19th November 2022)

Authors:
Zanoni, Enrico; Rampazzo, Fabiana; De Santi, Carlo; Gao, Zhan; Sharma, Chandan; Modolo, Nicola; Verzellesi, Giovanni; Chini, Alessandro; Meneghesso, Gaudenzio; Meneghini, Matteo
Journal:
Physica status solidi
Issue:
Volume 219:Issue 24(2022)
Page Start:
n/a
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Journal Article
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4. Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress. (November 2021)

Authors:
Gao, Zhan; Rampazzo, Fabiana; Meneghini, Matteo; Modolo, Nicola; De Santi, Carlo; Blanck, Hervé; Stieglauer, Hermann; Sommer, Daniel; Grünenpütt, Jan; Kordina, Olof; Chen, Jr-Tai; Jacquet, J-C; Lacam, C.; Piotrowicz, S.; Meneghesso, Gaudenzio; Zanoni, Enrico
Journal:
Microelectronics and reliability
Issue:
Volume 126(2021)
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Record Type:
Journal Article
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5. Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation. (September 2019)

Authors:
Sharma, Chandan; Modolo, Nicola; Chen, Hsi-Han; Tseng, Yang-Yan; Tang, Shun-Wei; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Singh, Rajendra; Wu, Tian-Li
Journal:
Microelectronics and reliability
Issue:
Volume 100/101(2019)
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Record Type:
Journal Article
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6. Understanding the effects of off-state and hard-switching stress in gallium nitride-based power transistors. (12th November 2020)

Authors:
Modolo, Nicola; De Santi, Carlo; Minetto, Andrea; Sayadi, Luca; Sicre, Sebastien; Prechtl, Gerhard; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Journal:
Semiconductor science and technology
Issue:
Volume 36:Number 1(2021)
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Record Type:
Journal Article
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