1. Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. (20th November 2019) Authors: Mo, Haifeng; Zhang, Yaohui; Song, Helun Other Names: Hasan S. M. Rezaul Academic Editor. Journal: Active and passive electronic components Issue: Volume 2019(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Improving Linearity and Robustness of RF LDMOS by Mitigating Quasi-Saturation Effect. (14th July 2019) Authors: Mo, Haifeng; Zhang, Yaohui; Song, Helun Other Names: Ghibaudo Gerard Academic Editor. Journal: Active and passive electronic components Issue: Volume 2019(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗