1. On the Origin of the Gate Oxide Failure Evaluated by Raman Spectroscopy. (31st March 2015) Authors: Yokogawa, Ryo; Tomita, Motohiro; Mizukoshi, Toshikazu; Hirano, Takehiro; Kusano, Kenichiro; Sasaki, Katsuhiro; Ogura, Atsushi Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 237 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗