1. (Invited) Characterization of Thin Passive Film-Electrolyte Junctions. The Amorphous Semiconductor (a-SC) Schottky Barrier Approach. (5th January 2017) Authors: Di Quarto, Francesco; Di Franco, Francesco; Miraghei, Shahab; Santamaria, Monica; La Mantia, Fabio Journal: ECS transactions Issue: Volume 75:Number 38(2016) Page Start: 29 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗