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Author/Creator Min, Kwan Hong

1. Analysis of the negative charges injected into a SiO2/SiNx stack using plasma charging technology for field‐effect passivation on a boron‐doped silicon surface. (4th October 2020)

Authors:
Min, Kwan Hong; Hwang, Jeong‐Mo; Cho, Eunwan; Song, Hee‐eun; Park, Sungeun; Rohatgi, Ajeet; Kim, Donghwan; Lee, Hae‐Seok; Kang, Yoonmook; Ok, Young‐Woo; Kang, Min Gu
Journal:
Progress in photovoltaics
Issue:
Volume 29:Number 1(2021)
Page Start:
54
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. Interface analysis of ultrathin SiO2 layers between c‐Si substrates and phosphorus‐doped poly‐Si by theoretical surface potential analysis using the injection‐dependent lifetime. (9th November 2020)

Authors:
Choi, Sungjin; Baek, Jimin; Kim, Taejun; Min, Kwan Hong; Jeong, Myeong Sang; Song, Hee‐eun; Kang, Min Gu; Kim, Donghwan; Kang, Yoonmook; Lee, Hae‐Seok; Myoung, Jae‐Min; Park, Sungeun
Journal:
Progress in photovoltaics
Issue:
Volume 29:Number 1(2021)
Page Start:
32
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

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