1. Tunneling leakage in ultrashort-channel MOSFETs—From atomistics to continuum modeling. (November 2022) Authors: Prentki, Raphaël J.; Harb, Mohammed; Zhou, Chenyi; Philippopoulos, Pericles; Beaudoin, Félix; Michaud-Rioux, Vincent; Guo, Hong Journal: Solid-state electronics Issue: Volume 197(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗