1. Investigating two-stage degradation of threshold voltage induced by off-state stress in AlGaN/GaN HEMTs. (7th January 2022) Authors: Lin, Yu-Shan; Chen, Yi-Lin; Chang, Ting-Chang; Ciou, Fong-Min; Zhu, Qing; Tai, Mao‐Chou; Su, Wan-Ching; Kuo, Ting-Tzu; Chen, Kuan-Hsu; Zhu, Jie-Jie; Mi, Min-Han; Ma, Xiao-Hua; Hao, Yue Journal: Semiconductor science and technology Issue: Volume 37:Number 2(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗