1. Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates. (December 2021) Authors: Upadhyay, M.; Ben Elbahri, M.; Mezhoud, M.; Coq Germanicus, R.; Lüders, U. Journal: Solid-state electronics Issue: Volume 186(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗