1. Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device. Issue 1 (2015) Authors: Putek, Piotr; Meuris, Peter; Günther, Michael; Maten, Jan ter; Pulch, Roland; Wieers, Aarnout; Schoenmaker, Wim Journal: IFAC-PapersOnLine Issue: Volume 48:Issue 1(2015) Page Start: 938 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device★. Issue 1 (2015) Authors: Putek, Piotr; Meuris, Peter; Günther, Michael; Maten, Jan ter; Pulch, Roland; Wieers, Aarnout; Schoenmaker, Wim Journal: IFAC-PapersOnLine Issue: Volume 48:Issue 1(2015) Page Start: 938 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗