1. Gain measurements on VCSEL material using segmented contact technique. (16th February 2023) Authors: Hentschel, C; Allford, C P; Gillgrass, S-J; Travers-Nabialek, J; Forrest, R; Baker, J; Meiklejohn, J; Powell, D; Meredith, W; Haji, M; Davies, J I; Shutts, S; Smowton, P M Journal: Journal of physics Issue: Volume 56:Number 7(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Targeted defect analysis in VCSEL oxide windows using 3D slice and view. (11th May 2021) Authors: Sun, X; Rickard, W D A; Ironside, C N; Kostakis, I; Missous, M; Powell, D; Anjomshoaa, A; Meredith, W Journal: Semiconductor science and technology Issue: Volume 36:Number 6(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗