1. Trap-assisted tunnelling and Shockley-Read-Hall lifetime of extended defects in In.53Ga.47As p+n junction. (May 2019) Authors: Hsu, P C (Brent); Simoen, E; Eneman, G; Merckling, C; Alian, A; Langer, R; Collaert, N; Heyns, M Journal: Journal of physics Issue: Volume 1190(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗