1. Introduction to the special issue on Mutation Testing. (August 2015) Authors: Jia, Yue; Merayo, Mercedes; Harman, Mark Other Names: Jia Yue guestEditor.; Merayo Mercedes guestEditor.; Harman Mark guestEditor. Journal: Software testing, verification & reliability Issue: Volume 25:Number 5/7(2015) Page Start: 461 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗