1. 'S13‐1955C': A high‐yielding conventional soybean with high oil content, multiple disease resistance, and broad adaptation. Issue 2 (29th April 2021) Authors: Chen, P.; Shannon, G.; Scaboo, A.; Crisel, M.; Smothers, S.; Clubb, M.; Selves, S.; Vieira, C. C.; Ali, M. L.; Lee, D.; Nguyen, H. T.; Li, Z.; Mitchum, M. G.; Bond, J.; Meinhardt, C.; Usovsky, M.; Li, S.; Mengistu, A.; Robbins, R. T. Journal: Journal of plant registrations Issue: Volume 15:Issue 2(2021) Page Start: 318 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 'S16‐14730C': A high‐yielding conventional soybean cultivar with indeterminate growth habit and multiple disease resistance adapted to the Mid‐South. Issue 2 (21st April 2022) Authors: Chen, P.; Shannon, G.; Scaboo, A.; Crisel, M.; Smothers, S.; Clubb, M.; Selves, S.; Vieira, C. C.; Ali, M. L.; Lee, D.; Lord, N.; Nguyen, H. T.; Li, Z.; Mitchum, M. G.; Bond, J.; Meinhardt, C.; Usovsky, M.; Li, S.; Mengistu, A.; Zhang, B. Journal: Journal of plant registrations Issue: Volume 16:Issue 2(2022) Page Start: 287 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. (September 2018) Authors: Almeida, R.B.; Marques, C.M.; Butzen, P.F.; Silva, F.R.G.; Reis, R.A.L.; Meinhardt, C. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 196 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Circuit design using Schmitt Trigger to reliability improvement. (November 2020) Authors: Zimpeck, A.L.; Meinhardt, C.; Artola, L.; Hubert, G.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. (September 2017) Authors: Calienes, W.E.; de Aguiar, Y.Q.; Meinhardt, C.; Vladimirescu, A.; Reis, R. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 655 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. (September 2017) Authors: de Aguiar, Y.Q.; Artola, L.; Hubert, G.; Meinhardt, C.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 660 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Evaluation of variability using Schmitt trigger on full adders layout. (September 2018) Authors: Moraes, L.B.; Zimpeck, A.L.; Meinhardt, C.; Reis, R. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 116 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Gate mapping impact on variability robustness in FinFET technology. (September 2019) Authors: Brendler, L.H.; Zimpeck, A.L.; Meinhardt, C.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Genetic architecture of cyst nematode resistance revealed by genome-wide association study in soybean. (December 2015) Authors: Vuong, T.; Sonah, H.; Meinhardt, C.; Deshmukh, R.; Kadam, S.; Nelson, R.; Shannon, J.; Nguyen, H. Journal: BMC genomics Issue: Volume 16:Number 1(2015) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Impact of different transistor arrangements on gate variability. (September 2018) Authors: Zimpeck, A.L.; Meinhardt, C.; Artola, L.; Hubert, G.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗