1. (Invited) Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates. (13th April 2015) Authors: Kirste, Lutz; Danilewsky, Andreas N.; Sochacki, Tomasz; Köhler, Klaus; Zajac, Marcin; Kucharski, Robert; Boćkowski, Michal; McNally, Patrick J. Journal: ECS transactions Issue: Volume 66:Number 1(2015) Page Start: 93 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Assessing dependency of part properties on the printing location in laser-powder bed fusion metal additive manufacturing. (March 2022) Authors: Mussatto, Andre; Groarke, Robert; Vijayaraghavan, Rajani K.; Hughes, Cian; Obeidi, Muhannad Ahmed; Doğu, Merve Nur; Yalçin, Mustafa Alp; McNally, Patrick J.; Delaure, Yan; Brabazon, Dermot Journal: Materials today communications Issue: Volume 30(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Highly enhanced UV responsive conductivity and blue emission in transparent CuBr films: implication for emitter and dosimeter applications. Issue 39 (28th September 2017) Authors: Vijayaraghavan, Rajani K.; Chandran, Deepak; Vijayaraghavan, Ratheesh K.; McCoy, Anthony P.; Daniels, Stephen; McNally, Patrick J. Journal: Journal of materials chemistry Issue: Volume 5:Issue 39(2017) Page Start: 10270 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Remote sensing of a low pressure plasma in the radio near field. (24th August 2017) Authors: Kelly, Seán; McNally, Patrick J. Journal: Applied physics express Issue: Volume 10:Number 9(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Upcycling natural Limestone waste for thermochemical energy storage by utilising tailored CaZrO3 nanoadditives. Issue 8 (8th March 2023) Authors: Anwar, Rehan; Navrátil, Jan; Vijayaraghavan, Rajani K.; McNally, Patrick J.; Otyepka, Michal; Błoński, Piotr; Sofianos, M. Veronica Journal: Materials advances Issue: Volume 4:Issue 8(2023) Page Start: 1905 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. X-ray imaging of silicon die within fully packaged semiconductor devices. Issue 2 (June 2021) Authors: Tanner, Brian K.; McNally, Patrick J.; Danilewsky, Andreas N. Journal: Powder diffraction Issue: Volume 36:Issue 2(2021) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. X‐ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions. Issue 5 (30th August 2022) Authors: Tanner, Brian K.; Danilewsky, Andreas; McNally, Patrick J. Journal: Journal of applied crystallography Issue: Volume 55:Issue 5(2022) Page Start: 1139 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗