Author/Creator: Mbarek, S. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Mbarek, S.

1. Gate oxide degradation of SiC MOSFET under short-circuit aging tests. (September 2016)

Authors:: Mbarek, S.; Fouquet, F.; Dherbecourt, P.; Masmoudi, M.; Latry, O.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 415
Record Type:: Journal Article
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2. Gate oxide degradation of SiC MOSFET under short-circuit aging tests. (September 2016)

Authors:: Mbarek, S.; Fouquet, F.; Dherbecourt, P.; Masmoudi, M.; Latry, O.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 415
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Short-circuit robustness test and in depth microstructural analysis study of SiC MOSFET. (September 2017)

Authors:: Mbarek, S.; Dherbécourt, P.; Latry, O.; Fouquet, F.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 527
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗