1. Brittle fracture studied by ultra‐high‐speed synchrotron X‐ray diffraction imaging. Issue 4 (30th July 2022) Authors: Petit, Antoine; Pokam, Sylvia; Mazen, Frederic; Tardif, Samuel; Landru, Didier; Kononchuk, Oleg; Ben Mohamed, Nadia; Olbinado, Margie P.; Rack, Alexander; Rieutord, Francois Journal: Journal of applied crystallography Issue: Volume 55:Issue 4(2022) Page Start: 911 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlative STEM-HAADF and STEM-EDX tomography for the 3D morphological and chemical analysis of semiconductor devices. (22nd January 2021) Authors: Jacob, Martin; Sorel, Julien; Pinhiero, Rafael Bortolin; Mazen, Frederic; Grenier, Adeline; Epicier, Thierry; Saghi, Zineb Journal: Semiconductor science and technology Issue: Volume 36:Number 3(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗