1. Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species. (August 2014) Authors: Bauerdick, S.; Sanabia, J. E.; Mazarov, P.; Fridmann, J.; Bruchhaus, L.; Jede, R. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 312 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species. (August 2014) Authors: Bauerdick, S.; Sanabia, J. E.; Mazarov, P.; Fridmann, J.; Bruchhaus, L.; Jede, R. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 312 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Sputtering of silicon by atomic and cluster bismuth ions: An influence of projectile nuclearity and specific kinetic energy on the sputter yield. (June 2021) Authors: Tolstogouzov, A.; Mazarov, P.; Ieshkin, A.E.; Belykh, S.F.; Korobeishchikov, N.G.; Pelenovich, V.O.; Fu, D.J. Journal: Vacuum Issue: Volume 188(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗