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You searched for: Author/Creator Mattiazzo, SerenaLimit your search
- Mattiazzo, Serena [remove] 2
- 530.05 1
- 61.80.–x -- 73.40.Qv 1
- 621.38152 1
- Charge-based modeling -- Charge-trapping -- Defects -- Device reliability -- EKV -- Interface traps -- Mobile charge linearization -- Oxide-trapped charges -- 28-nm bulk MOSFETs -- Radiation damage -- Total ionizing dose 1
- Periodicals 1
- Physics 1
- Physics -- Periodicals 1
- Semiconducteurs -- Périodiques 1
- Semiconductors -- Periodicals 1
- total ionizing dose (TID) effects -- grad dose -- x-ray and protons -- 65-nm CMOS transistors 1